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Burn-in/Lifetest Tester
Burn-in/Lifetest Tester
Drive current
0.1--20A
power supply
210-230V AC 25A/50Hz
Temperature control
TEC + water
Power measurement
0-20W
Spectral measurement
350-1100nm /900-1700nm
Equipment size
1360mm*2100mm*694mm
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Product Description

Product Summary:


After encapsulation (COS, TO56, C-mount, F-mount, CCP, butter-fly, etc.), semiconductor laser chip devices are carried out on a controlled temperature workbench.


- Realize long-term life test and short-term aging test for high-power COS, C-mount and TO package modules with good patch


- Long-term life test type: it can perform accelerated life test on 100 devices at the same time, and monitor optical power and wavelength of each device


- Short-term aging type: can perform short-term aging test on 250 devices at the same time, without monitoring optical power and wavelength


- Hybrid: the first equipment in the industry to combine long-term life testing and short-term aging testing


- Standard current range 0-18A (maximum current up to 30A when the total load power is relatively small)






Product features:


- High integration (100pcs high-power laser chip can be tested at the same time)


- Monitor and record the state of laser chip at each station in real time: laser power, peak wavelength and spectral width


- Excellent internal clean environment (100-1000)


- Good safety protection and fault warning mechanism


- Real-time monitoring and recording of equipment operating status: temperature at multiple points, cooling water flow, power current & voltage


- Friendly man-machine interface, simple operation, easy to use


- Provides special software for offline aging data analysis


- Provides the function of stopping and restarting the aging test during the test


- The number of laser chips can be increased or reduced flexibly, and the aging time of each laser chip can be accumulated independently